| The failure rate and causes ultrasound probe device |
| 2016-08-01 |
|
In the cable leakage, shell damage and sheath damage several aspects focused probe damage, and the damage mostly is because the use of time is too long or the operator used improperly, probe by outside influence and failure. Crystal failure is the main operator when used carelessly the probe touched on a hard object, the probe cracking, chip breaking or is using the coupling agent is not qualified, long-term use of probe damage large, serious will probe surface blistering, cracking. The failure of the lens is mainly caused by the long-term use of natural wear, scratches, cracking, corrosion, rubber, foam or external damage caused by collision. When the operator does not normally install or remove the probe and switch when the improper operation, will cause the circuit board burned out.
|
 |
|
Msn | 
Yahoo | 
Skype | 
Gmail talk 
